Picture of Stephen Urquhart

Stephen Urquhart B.Sc., Ph.D, P.Chem Professor

Thorvaldson 157

Research Area(s)

  • X-ray microscopy
  • X-ray absorption spectroscopy
  • Synchrotron Radiation
  • Surface Science
  • Nanoscience
  • ptychography

About me

I am a Professor of Chemistry and an associate member of the Department of Physics. I supervise Chemistry and Physics undergraduate and graduate students and postdoctoral fellows, and teach physical and introductory chemistry courses. 

My research is focused on applied and fundamental aspects of X-ray spectroscopy and microscopy, ranging from fundamental molecular spectroscopy to the structural properties of organic nanomaterials and semiconductor devices. My research group is involved in the development of the Spectromicroscopy beamline at the Canadian Light Source.

I intend to enrol new graduate students in the fall of 2020, for research into X-ray spectroscopy and microscopy at the Canadian Light Source. If you are completing an undergraduate degree in chemistry or physics, satisfy the admission requirements listed at https://cgps.usask.ca and have course work in quantum mechanics / spectroscopy, please email me. 

I am active in the professional development and regulation, serving as president of the Association of the Professional Chemist of Saskatchewan (APCS, www.saskpchem.ca).


ResearcherID: https://publons.com/researcher/1345821/stephen-urquhart/

74. A. Zuhaib and S.G. Urquhart, 2021, Internal molecular conformation of organic glasses: A NEXAFS study, Journal of Chemical Physics, 155, 034503. DOI: 10.1063/5.0054442

73. Sadegh Shokatian, Jian Wang and Stephen Urquhart, 2020,  Effect of Chain Length on the Near Edge X-ray Absorption Fine Structure Spectra of Liquid n-Alkanes, Chemical Physics Letters, 752, 137564. DOI: 10.1016/j.cplett.2020.137564

72. Sadegh Shokatian* and Stephen Urquhart, 2019, Near Edge X-ray Absorption Fine Structure Spectra of Linear n-Alkanes: Variation with Chain Length, Journal of Electron Spectroscopy and Related Phenomena, 236, 18-25. DOI: 10.1016/j.elspec.2019.08.001  USask Repository  

A1. Stephen Urquhart and Adam Hitchcock, 2019, XRM2018, Synchrotron Radiation News, 32:2, 28-29, DOI: 10.1080/08940886.2019.1582286 (not peer reviewed; conference report)

71. Sahan D. Perera, Jian Wang and Stephen G. Urquhart, 2018, Linear Dichroism in the NEXAFS Spectra of N-Alkane Crystalline Polymorphs, J. Electron Spectrosc. and Rel. Phen., 2019 232, 5-10, DOI: 10.1016/j.elspec.2018.12.004 USask Repository

70. Sahan D. Perera, Sadegh Shokatian, Jian Wang, and Stephen G. Urquhart, 2018. Temperature Dependence in the NEXAFS Spectra of n-Alkane, The Journal of Physical Chemistry A 2018 122 (49), 9512-9517. DOI: 10.1021/acs.jpca.8b10713   USask Repository   

69. A. F. G. Leontowich, R. Berg, C. N. Regier, D. M. Taylor, J. Wang, D. Beauregard, J. Geilhufe, J. Swirsky, J. Wu, C. Karunakaran,  A. P. Hitchcock, and  S. G. Urquhart, 2018. Cryo scanning transmission x-ray microscope optimized for spectrotomography. Review of Scientific Instruments 2018 89:9. DOI: 10.1063/1.5041009

68. Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N.; Taylor, D. M.; Beauregard, D.; Swirsky, J.; Karunakaran, C.; Hitchcock, A. P.; Urquhart, S. G. Soft X-Ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 2018, 24 (S2), 258–259. DOI: 10.1017/S1431927618013648

67. Kolmakov, A.; Strelcov, E.; Guo, H.; Yulaev, A.; Hoskins, B.; Holland, G.; Nemsak, S.; Schneider, C. M.; Wang, J.; Appathurai, N.; Urquhart, S.; Gunther, S.; Gregoratti, L.; Amati, M.; Kiskinova, M. Graphene Windows Enable Photoelectron Microscopies of Liquid Samples. Microscopy and Microanalysis 2018, 24(S2), 64–67. DOI: 10.1017/S1431927618012746

66. Wang, J.; Jan Geilhufe; Lu, Y.; Dynes, J. J.; Zhou, J.; Berg, R.; Leontowich, A. F. G.; Coulthard, I.; Swirsky, J.; Karunakaran, C.; Hitchcock, A. P.; Urquhart, S. G. Soft X-Ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 2018, 24 (S2), 228–229. DOI: 10.1017/S1431927618013491

65. A.F.G. Leontowich, D.M. Taylor, J. Wang, C.N. Regier, T.Z. Regier, R. Berg, D. Beauregard, J.J. Dynes, C. Senger, J. Swirsky, C. Karunakaran, A.P. Hitchcock and S.G. Urquhart, 2017.  Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray. Journal of Physics: Conference Series 849, 0123045. DOI: 10.1088/1742-6596/849/1/012045

64. S.G. Urquhart*, M. Martinson, S. Eger, V. Murcia, H. Ade, and B.A. Collins, 2017. Connecting Molecular Conformation to Aggregation in P3HT Using Near Edge X-ray Absorption Fine Structure Spectroscopy, J. Phys. Chem. C, 121, 21720021728. DOI: 10.1021/acs.jpcc.7b07143  USask repository 

63. S.D. Perera, S.G. Urquhart*, 2017. Systematic Investigation of π–π Interactions in Near-Edge X-ray Fine Structure (NEXAFS) Spectroscopy of Paracyclophanes, J. Phys. Chem. A, 2017, 121 (26), pp 4907–4913, DOI: 10.1021/acs.jpca.7b03823. USask repository  

62. H. Guo, E. Strelcov, A. Yulaev, J. Wang, N. Appathurai, S.G. Urquhart, J. Vinson, S. Sahu, M. Zwolak, and A. Kolmakov, 2017. Enabling photoemission electron microscopy in liquids via graphene-capped micro channel arrays, Nano Letters, 17, 1034 - 1041. DOI: 10.1021/acs.nanolett.6b04460

61. A. Ritchie, W.  Cao, M. Dasog, T.K. Purkait, C. Senger, Y.F. Hu, Q.F. Xiao, J.G.C. Veinot and S.G. Urquhart, 2016. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals.The Journal of Chemical Physics, 145, 154703. DOI: 10.1063/1.4964371 USask Repository

60. Andrew Ritchie, Shaylin Eger, Chelsey Wright, Daniel Chelladurai, Cuyler Borrowman, Weine Olovsson, Martin Magnuson, Jai Verma, Debdeep Jena, Huili Grace Xing, Christian Dubuc, Stephen Urquhart*, Strain Sensitivity in the Nitrogen 1s NEXAFS Spectra of Gallium Nitride, 2014. Applied Surface Science. 316: 232-246. DOI: 10.1016/j.apsusc.2014.07.070

59.  S. Behyan, Y. Hu, and S.G. Urquhart*, 2014. Chemical Sensitivity of Sulfur 1s NEXAFS Spectroscopy II: Speciation of Disulfide Functional Groups. Chemical Physics Letters. 592: 109-113. DOI: 10.1016/j.cplett.2013.10.027

58. S. Behyan, Y. Hu, and S.G. Urquhart*, 2013. Chemical Sensitivity of Sulfur 1s NEXAFS Spectroscopy I: Speciation of Sulfoxides and Sulfones. Chemical Physics Letters. 592: 69-74. DOI: 10.1016/j.cplett.2013.10.026

57. P. Pangamol, C. Sirisinha, Y.F. Hu, S.G. Urquhart, 2013, Effectiveness of by-product Sulfur from Petroleum Refining as a Rubber Vulcanizing Agent: An XANES Investigation. Industrial & Engineering Chemistry Research. 52: 17179-17183.   DOI 10.1021/ie4031456.

56.   S. Behyan, Y. Hu, and S.G. Urquhart*, 2013. Sulfur 1s Near Edge X-ray Absorption Fine Structure Spectroscopy of Thiophenic and Aromatic Thioether Compounds. Journal of Chemical Physics. 138: 214302. DOI: 10.1063/1.4807604

55.   M. Masnadi and S.G. Urquhart*, 2013, Indirect Molecular Epitaxy: Deposition of n-Alkane Thin Films on Au coated NaCl(001) and HOPG(0001) Surfaces, Langmuir. 29: 6302-6307. DOI: 10.1021/la304944k

54.  W. Cao, M. Masnadi, S. Eger, M. Martinson, Q.-F. Xiao, Y.-F. Hu, J.-M. Baribeau, J.C. Woicik, A.P. Hitchcock, S.G. Urquhart, 2013. Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films. Applied Surface Science. 265: 358-362 DOI: 10.1016/j.apsusc.2012.11.012 

53.  J. Lipton-Duffin, J. Miwa, S.G. Urquhart, G. Contini, A. Cossaro, L. Casalis, J. Barth, L. Floreano, A. Morgante, and F. Rosei, 2012. Binding geometry of hydrogen-bonded chain motif in self-assembled gratings and layers on Ag(111). Langmuir. 28: 14291-14300. DOI: 10.1021/la303010p

52.  M. Masnadi and S.G. Urquhart, 2012. The Effect of Substrate Temperature on the Epitaxial Growth of Oriented n-Alkane Thin Films on Graphite. Langmuir 28: 12493-12501 DOI: 10.1021/la3020145

51.    N. Schmidt, T. Clark, S.G. Urquhart, R. Fink, 2011. Electron-Vibron Coupling in Halogenated Acenaphthenequinone Upon O K-Edge Soft X-Ray Absorption. Journal of Chemical Physics 135: 144301 (6 journal pages). DOI: 10.1063/1.3646732 

50.    S. Behyan, Y. Hu, and S.G. Urquhart, 2011. Sulfur 1s Near-Edge X-Ray Absorption Fine Structure (NEXAFS) of Thiol and Thioether Compounds. Journal of Chemical Physics134: 244304 (7 journal pages) DOI: 10.1063/1.3602218

49.    E. Otero, N. Kosugi, S.G. Urquhart, 2009. Strong Double Excitation and Open-Shell Features in the Near-Edge X-Ray Absorption Fine Structure Spectroscopy of Ferrocene and Ferrocenium Compounds. Journal of Chemical Physics 131(11): 114313 (8 journal pages).  DOI: 10.1063/1.3230101

48.    E. Otero, P.O. Shipman, A.S. Abd-El-Aziz and S.G. Urquhart, 2009. Substituent Effects in the Iron 2p and Carbon 1s Edge Near-Edge X-ray Absorption Fine Structure Spectroscopy of Metal Arene Complexes and Polymers. Organometallics 28(7): 2160 – 2172. DOI: 10.1021/om800769t

47.    J. M. MacLeod, J. A. Lipton-Duffin, U. Lanke, S. G. Urquhart, and F. Rosei, 2009. Shape Transition in Very Large Germanium Islands on Si(111). Applied Physics Letters 94: 103109 (3 journal pages). DOI: 10.1063/1.3093674

46.    D. Covelli, D. Hernández-Cruz, B.M. Haines, V. Munoz, O. Omotoso, R. Mikula, S.G. Urquhart*, 2009. NEXAFS Microscopy Studies of the Association of Hydrocarbon Thin Films with Fine Clay Particles. Journal of Electron Spectroscopy and Related Phenomena 173(1): 1 – 4 DOI:10.1016/j.elspec.2009.02.012

45.    S. Qaqish, S. G. Urquhart, U. Lanke, S. Brunet, M. Paige*, 2009. Phase-Separation of Palmitic Acid and Perfluorooctadecanoic Acid in Mixed Langmuir Blodgett Monolayer Films.Langmuir 25(13): 7401 – 7409. DOI: 10.1021/la900308b

44.    E. Otero, P.O. Shipman, A.S. Abd-El-Aziz and S.G. Urquhart*, 2008. Near-Edge X-ray Absorption Fine Structure Spectroscopy Study of the Photolytic Process in Poly(phenyl thioether) with Pendant Iron Moieties. Macromolecules 41(24): 9532 – 9541. DOI: 10.1021/ma801826p

43.    S. Christensen, U.D. Lanke, B. Haines, S.E. Qaqish, M.F. Paige, and S.G. Urquhart*, 2008. Structural and Compositional Mapping of a Phase-Separated Langmuir-Blodgett Monolayer by X-Ray Photoelectron Emission Microscopy. Journal of Electron Spectroscopy and Related Phenomena 162: 107 – 114. DOI: 10.1016/j.elspec.2007.12.003

42.    E. Otero, R. G. Wilks, T. Regier, R. I. R. Blyth, A. Moewes, and S. G. Urquhart*, 2008. Substituent Effects in the Iron 2p and Carbon 1s Edge Near-Edge X-Ray Absorption Fine Structure (NEXAFS) Spectroscopy of Ferrocene Compounds. Journal of Physical Chemistry A 112: 624 – 634. DOI: 10.1021/jp074625w

41.    J. Fu and S.G. Urquhart*, 2007. Effect of Chain Length and Substrate Temperature on the Growth and Morphology of N-Alkane Thin Films. Langmuir 23: 2615 – 2622. DOI: 10.1021/la0630007

40.    E. Otero and S.G. Urquhart*, 2006. Nitrogen 1s Near-Edge X-ray Absorption Fine Structure Spectroscopy of Amino Acids: Resolving Zwitterionic Effects. Journal of Physical Chemistry A 110: 12121 – 12128. DOI: 10.1021/jp064082a

39.    Z. Alexandrová, P. Sehnal, I.G. Stará*, I. Starý*, D. Šaman, S.G. Urquhart and E. Otero, 2006. Modified Synthesis of Heptahelicene and its Resolution into Single Enantiomers.Collection of Czechoslovak Chemical Communications, 71: 1256 – 1264. DOI:10.1135/cccc20061256

38.    S.G. Urquhart*, R. Gillies, 2006. Matrix Effects in the Carbon 1s Near Edge X-Ray Absorption Fine Structure Spectra of Condensed Alkanes. Journal of Chemical Physics124(23): 234704 (8 journal pages). DOI:10.1063/1.2206589

37.    A. Schoell*, Y. Zou, D. Huebner, S.G. Urquhart, T. Schmidt, R. Fink, E. Umbach, 2005. A Comparison of Fine Structures in High-Resolution X-Ray-Absorption Spectra of Various Condensed Organic Molecules. Journal of Chemical Physics 123(4): 044509 (15 journal pages). DOI:10.1063/1.1978872

36.    J. Fu, S.G. Urquhart*, 2005. Linear Dichroism in the X-ray Absorption Spectra of Linear n-Alkanes. Journal of Physical Chemistry A 109(51): 11724 – 11732. DOI:10.1021/jp053016q

35.    S.G Urquhart*, R. Gillies, 2005. Rydberg-Valence Mixing in The Carbon 1s Near-Edge X-Ray Absorption Fine Structure Spectra of Gaseous Alkanes. Journal of Physical Chemistry A, 109 (10): 2151 – 2159. DOI: 10.1021/jp045370e

34.    R.R. Cooney, S.G. Urquhart*, 2004. Chemical Trends in the Near-Edge X-Ray Absorption Fine Structure of Monosubstituted and Para-Bisubstituted Benzenes. Journal of Physical Chemistry B, 108 (47): 18185 – 18191. DOI: 10.1021/jp046868j

33.    A. Scholl*, Y. Zou, L. Kilian., D. Hubner, D. Gador, C. Jung, S.G. Urquhart, T. Schmidt, R. Fink, E. Umbach, 2004. Electron-vibron Coupling in High-Resolution X-Ray Absorption Spectra of Organic Materials: NTCDA on Ag(111). Physical Review Letters 93(14): 146406 (4 journal pages). DOI: 10.1103/PhysRevLett.93.146406

32.    A. Scholl*, D. Hubner, Th. Schmidt, S.G. Urquhart, R. Fink, E. Umbach, 2004. Anharmonicity of the Core-Excited State Potential of an Organic Molecule from NEXAFS Vibronic Fine Structure. Chemical Physics Letters 392(4 – 6): 297 – 302. DOI:10.1016/j.cplett.2004.05.073

31.    C. Morin, A.P. Hitchcock*, R.M. Cornelius, J.L. Brash, S.G. Urquhart, A. Scholl, A. Doran, 2004. Selective Adsorption of Protein on Polymer Surfaces Studied by Soft X-Ray Photoemission Electron Microscopy. Journal of Electron Spectroscopy and Related Phenomena 137 – 140: 785 – 794.  DOI:10.1016/j.elspec.2004.02.158

30.    D.A. Winesett, H. Ade*, S.G. Urquhart, A.J. Dias, 2003. Application of Scanning Transmission X-Ray Microscopy to the Rubber Industry. Rubber Chemistry & Technology Journal76(4): 803 – 811. DOI: 10.5254/1.3547773

29.    A. Scholl, R. Fink, E. Umbach, G.E. Mitchell, S.G. Urquhart, H. Ade*, 2003. Towards a Detailed Understanding of the NEXAFS Spectra of Bulk Polyethylene Copolymers and Related Alkanes. Chemical Physics Letters 370(5,6): 834 – 841. DOI:10.1016/S0009-2614(03)00215-X

28.    O. Dhez, H. Ade*, S.G. Urquhart, 2003. Calibrated NEXAFS Spectra of Some Common Polymers. Journal of Electron Spectroscopy and Related Phenomena 128(1): 85 – 96. DOI:10.1016/S0368-2048(02)00237-2

27.    S.G. Urquhart*, H. Ade, 2002. Trends in the Carbonyl Core (C 1s, O 1s) à π*C=O Transition in the Near-Edge X-ray Absorption Fine Structure Spectra of Organic Molecules.Journal of Physical Chemistry B 106(34): 8531 – 8538. DOI: 10.1021/jp0255379

26.    T. Coffey, S.G. Urquhart, and H. Ade*, 2002. Characterization of the Effects of Soft X-ray Irradiation on Polymers. Journal of Electron Spectroscopy and Related Phenomena122(1): 65 – 78. DOI:10.1016/S0368-2048(01)00342-5

25.    E.G. Rightor*, S.G. Urquhart, A.P. Hitchcock, H. Ade, A.P. Smith, G.E. Mitchell, R.D. Priester, A. Aneja, G. Appel, G. Wilkes, W.E. Lidy, 2002. Identification and Quantitation of Urea Precipitates in Flexible Polyurethane Foam Formulations by X-ray Spectromicroscopy. Macromolecules 35(15): 5873 – 5882. DOI: 10.1021/ma0122627

24.    G.E. Mitchell*, L.R. Wilson, M.T. Dineen, S.G. Urquhart, F. Hayes, E.G. Rightor, A.P. Hitchcock, H. Ade, 2002. Quantitative Characterization of Microscopic Variations in the Cross-Link Density of Gels. Macromolecules 35(4): 1336 – 1341. DOI: 10.1021/ma010840d

23.    Y. Zhang, S. Ge, B. Tang, T. Koga, M.H. Rafailovich*, J.C. Sokolov, D.G. Peiffer, Z. Li, A.J. Dias, K.O. McElrath, M.Y. Lin, S.K. Satija, S.G. Urquhart, H. Ade, and D. Nguyen, 2001. The Effect of Carbon Black and Silica Fillers in Elastomer Blends. Macromolecules 34(20): 7056 – 7065. DOI: 10.1021/ma010183p

22.    A.P. Smith, S.G. Urquhart, D.A. Winesett, G. Mitchell, H. Ade*, 2001. Use of Near Edge X-ray Absorption Fine Structure Spectromicroscopy to CharacterizeMulticomponent Polymeric Systems. Applied Spectroscopy 55(12): 1676 – 1681. DOI: 10.1366/0003702011954008

21.    Y. Zhang, W. Li, B. Tang, S. Ge, X. Hu, M.H. Rafailovich*, J.C. Sokolov, D. Gersappe, D.G. Peiffer, Z. Li, A.J. Dias, K.O. McElrath, M.Y. Lin, S.K. Satija, S.G. Urquhart, H. Ade, 2001. Interfacial Properties of Elastomer Blends as Studied by Neutron Reflectivity. Polymer 42(21): 9133 – 9141. DOI: 10.1016/S0032-3861(01)00370-6

20.    A.P. Hitchcock*, I. Koprinarov, T. Tyliszczak, E.G. Rightor, G.E. Mitchell, M.T. Dineen, F. Hayes, W. Lidy, R.D. Priester, S.G. Urquhart, A.P. Smith, and H. Ade, 2001. Optimization of Scanning Transmission X-Ray Microscopy for the Identification and Quantitation of Reinforcing Particles in Polyurethanes. Ultramicroscopy 88(1): 33 – 49. DOI: 10.1016/S0304-3991(00)00113-3

19.    S.G. Urquhart, H. Ade, M. Rafailovich, J.S. Sokolov, Y. Zhang, 2000. Chemical and Vibronic Shifts in the High-Resolution Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectra of Polystyrene Isotopomers. Chemical Physics Letters 322: 412 – 418. DOI: 10.1016/S0009-2614(00)00441-3

18.    S.G. Urquhart, A.P. Hitchcock*, A.P. Smith, H.W. Ade, B. Lessard, W. Lidy, E.G. Rightor and G.E. Mitchell, 1999. NEXAFS Spectromicroscopy of Polymers: Overview and Quantitative Analysis of Polyurethane Polymers. Journal of Electron Spectroscopy100: 119 – 135.  DOI:10.1016/S0368-2048(99)00043-2

17.    S.G. Urquhart*, A.P. Smith, H.W. Ade, A.P. Hitchcock, E.G. Rightor and W. Lidy1999.Near Edge X-ray Absorption Fine Structure Spectroscopy of MDI and TDI Polyurethane Polymers.Journal of Physical Chemistry B 103(22): 4603 – 4610. DOI: 10.1021/jp990059w

16.    J.F. Lehmann, S.G. Urquhart, L. Ennis, A.P. Hitchcock*, K. Hatano, S. Gupta and M.K. Denk, 1999. Core Excitation Spectroscopy of Stable Cyclic Diaminocarbenes, Silylenes and Germylenes. Organometallics 18(10): 1862 – 1872. DOI: 10.1021/om980882z

15.    R. Giebler, B. Schulz, J. Reiche, L. Brehmer, M. Wühn, Ch. Wöll, A.P. Smith, S.G. Urquhart, H. Ade and W.E.S. Unger*, 1999. Near Edge X-ray Absorption Fine Structure Spectroscopy on Order Films of Amphiphilic Derivatives of 2,5-Diphenyl-1,3,4-Oxadiazoles. Langmuir 15(4): 1291 – 1298. DOI: 10.1021/la980888t

14.    S.G. Urquhart, A.P. Hitchcock*, J.F. Lehmann and M. Denk, 1998. Probing Delocalization in Stable Silylenes: Core Excitation Spectra of Si(NRCH=CHNR), Si(NRCH2CH2NR), H2Si(NRCH=CHNR), and H2Si(NRCH2CH2NR) (R = t-Bu). Organometallics 17(11): 2352 – 2360.  DOI: 10.1021/om9709188

13.    I.G. Eustatiu, B. Huo, S.G. Urquhart and A.P. Hitchcock*,1998. Isomeric Sensitivity of the C 1s Spectra of Xylenes. Journal of Electron Spectroscopy and Related Phenomena94(3): 243 – 252. DOI: 10.1016/S0368-2048(98)00189-3

12.    S.G. Urquhart, C.C. Turci, T. Tyliszczak, M.A. Brook and A.P. Hitchcock*, 1997. Core Excitation Spectroscopy of Phenyl- and Methyl-substituted Silanol, Disiloxane and Disilane Compounds: Evidence for p-delocalization Across the Si-CPhenyl Bond. Organometallics 16(10): 2080 – 2088. DOI: 10.1021/om961028f

11.    S.G. Urquhart, A.P. Hitchcock*, A.P. Smith, H. Ade and E.G. Rightor, 1997. Inner-shell Excitation Spectroscopy of Polymer and Monomer Isomers of Dimethyl Phthalate. Journal of Physical Chemistry B 101(13): 2267 – 2276. DOI: 10.1021/jp963419d

10.    A.P. Hitchcock*, S.G. Urquhart, A.T. Wen, A.L.D. Kilcoyne, T. Tyliszczak, E. Rühl, N. Kosugi, J.D. Bozek, J.T. Spencer, D.N. McIlroy and P. Dowben, 1997. Inner-Shell Excitation Spectroscopy of Closo-carboranes. Journal of Physical Chemistry B 101(18): 3483 – 3493. DOI: 10.1021/jp9622849

9.      E.G. Rightor, A.P. Hitchcock*, H. Ade, R.D. Leapman, S.G. Urquhart, A.P. Smith, G. Mitchell, D. Fischer, H.J. Shin and T. Warwick, 1997. Spectromicroscopy of Poly(ethylene terepthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss Spectroscopy. Journal of Physical Chemistry B 101(11): 1950 – 1960. DOI: 10.1021/jp9622748

8.      C. Turci, S.G. Urquhart and A.P. Hitchcock*, 1996. Inner Shell Energy Loss Spectroscopy of Aniline, Nitrobenzene and Nitroanilines. Canadian Journal of Chemistry 74: 851 – 869. DOI: 10.1139/v96-094

7.      J.Z. Xiong, D.T. Jiang, Z.F. Liu, K.M. Baines, T.K. Sham, S.G. Urquhart, A.T. Wen, T. Tyliszczak and A.P. Hitchcock*, 1996. Si Core Level Excitation of Hexamethyldisilane Studied by Synchrotron Radiation and Multiple-scattering Xα Calculations. Chemical Physics 203(1): 81 – 92. DOI:10.1016/0301-0104(95)00353-3

6.      S.G. Urquhart, A.P. Hitchcock*, R.D. Priester and E.G. Rightor, 1995. Analysis of Polyurethanes using Core Excitation Spectroscopy. Part II: Inner-shell Spectra of Ether, Urea and Carbamate Model Compounds. Journal of Polymer Science B: Polymer Physics 33: 1603 – 1620.DOI: 10.1002/polb.1995.090331105

5.      S.G. Urquhart, A.P. Hitchcock*, R.D. Leapman, R.D. Priester and E.G. Rightor, 1995. Analysis of Polyurethanes using Core Excitation Spectroscopy. Part I: Model Polyurethane Foam Polymers. Journal of Polymer Science B: Polymer Physics 33: 1593 – 1602. DOI: 10.1002/polb.1995.090331104

4.      S.G. Urquhart, J.Z. Xiong, A.T. Wen, T.K. Sham, K.M. Baines, G.G.B. de Souza and A.P. Hitchcock*, 1994. Inner Shell Spectroscopy of Compounds Containing Si-Si Bonds: Is There a Localized, Low Energy Si-Si Resonance?Chemical Physics 189(3): 757 – 768. DOI: 10.1016/0301-0104(94)00291-6

3. A.P. Hitchcock*, T. Tyliszczak, M.L.M. Rocco, J.T. Francis, S.G. Urquhart, Z.H. Lu, J.M. Baribeau and T.E. Jackman, 1994. Polarization Dependence of the Si 1s X-ray Absorption Spectra of Single Crystal Si-Ge Atomic Layer Superlattices and Si-Ge Alloys. Journal of Vacuum Science Technology A 12: 1142 – 1147. DOI: 10.1116/1.579181

2.  A.P. Hitchcock*, S.G. Urquhart and E.G. Rightor, 1992. Inner-shell Excitation Studies of Poly(ethyleneterephthalate) and Related Small Molecule Analogues by Electron Energy Loss Spectroscopy. Journal of Physical Chemistry 96(22): 8736 – 8750. DOI: 10.1021/j100201a015

1. E.G. Rightor*, G.P. Young, S.G. Urquhart, A.T. Wen and A.P. Hitchcock*, 1992. Correlation of Polymer(PET) Parallel-EELS Spectra with Spectra from Related Molecular Analogues. Microscopy: The Key Research Tool 22: 67 – 72. ISSN: 0146-6119

Teaching & Supervision

I supervise three PhD students and one M.Sc. student.


Materials, Surfaces and Nanostructures NEXAFS Physical Chemistry Surface Science X-ray absorption spectriscopy X-ray microcopy synchrotron

My research uses the tools of x-ray absorption spectroscopy and x-ray microscopy to study the structure and properties of materials. Scanning Transmission X-ray Microscopy (STXM) and PhotoElectron Emission Microscopy (PEEM) are forms of chemical imaging that combine the chemical sensitivity of Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy with high spatial resolution x-ray microscopy (35-50 nm spatial resolution for STXM). X-ray spectromicroscopy is developing as a valuable complement to traditional electron and scanned probe microscopy for materials research. My research is focused in two areas:

  • Materials Chemistry
    We use X-ray microscopy to study the structure and composition of complex, nanostructured materials, with an eye to understanding the thermodynamics and kinetics of nanostructure formation. Organic nanostructures are of particular interest, where we use epitaxy to control and pattern molecular orientation at microscopic length scales. We also study how semiconductor strain effects the light emitting properties of nanocrystalline silicon (in collaboration with Group IV Semiconductor; NSERC SPG funding) and phase separated Langmuir Blodgett thin films (in collaboration with M. Paige, Chemistry) 
  • Molecular Spectroscopy 
    The chemical sensitivity of Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy provides the exquisite sensitivity of x-ray microscopy for basic and applied materials chemistry analysis, particularly as it can provide detailed and quantitative chemical information at high spatial resolution (e.g. below 50 nm). My research combines experimental and computational studies to understand the structure - spectral relationships for organic molecules. These questions range from the practical to the esoteric, such as the nature of "matrix effects" in condensed molecules, orientation dependence in complex organic molecules, and the natural circular dichroism of chiral organic molecules at x-ray wavelengths.

Third generation synchrotron sources such as the Canadian Light Source offer new opportunities for materials analysis and for fundamental spectroscopy. I am closely involved in the development of new spectromicroscopy at the Canadian Light Source, consisting of an Elliptically Polarized Undulator (EPU) source, and two state-of- the-art x-ray microscopes, a Photoelectron emission microscope (PEEM) and a Scanning Transmission X-ray Microscope (STXM).